Micro and Nanoelectromechanical Systems
Oversampling is the process of capturing data points at a rate higher than the Nyquist rate, which is twice the highest frequency present in the signal. This technique helps improve the accuracy and resolution of measurements, especially in signal conditioning and readout circuits for MEMS/NEMS sensors. By collecting more samples, it becomes easier to reconstruct the original signal and reduce noise, which is crucial for achieving high-performance sensor outputs.
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