Intro to Mechanical Prototyping
Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows scientists to visualize and manipulate surfaces at the atomic level. It uses a tiny cantilever with a sharp tip that scans the surface, measuring forces between the tip and the sample to create detailed three-dimensional images. This technique is crucial in nanotechnology and micro-scale prototyping, as it enables researchers to analyze material properties and structures with extreme precision.
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